Basis of differentiation | Super resolution microscopy | Electron microscopy |
Definition | Is any type of microscopy which suprasses the resolution limit of typical light microscopy by at least a factor of two. | Is a microscope which uses accelerated beams of electrons (through electromagnetic lenses) |
Resolution | Typically from 10-250 nm | 0.2 nm |
Mechanism | Uses different methods such as STED, SIM, PALM to surpass the diffraction limit of light | Uses beams of electrons to generate images |
Field of view | In general has a comparatively larger field of view | Has a comparatively lower field of view |
Speed | Imaging is typically fast (35 milliseconds in STED microscopy) | Takes longer due to sample preparation |
Sample preparation | Is used in live-cell imaging and requires specialized fluorescent tags or dyes | Only dead and dried samples can be seen (requires sample fixation) |